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35 nanometers
Available in four diameters:
5 Structure: SiC with Steps Single Step Height: 0
standard) and can be handled like any ordinary grid
0µm 6 - 12 6
Pelcotec™ CDMS-XY-0.1C Options and Accessories 35 nanometersDESCRIPTION PRODUCT SPECIFICATIONS See mount selections, types A R Pelcotec CDMS XY Critical Dimension Magnification Standard Available as NIST Traceable or as Certified against NIST Standard Easy to use and very useful for quick and precise SEM, FESEM, FIB, CD SEM, LM, and AFM magnification calibration. Scale lines are provided in both X and Y axes for ease of 2 axis calibration without stage rotation. Fully featured and traceable calibration
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
US$ 33.00
