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For EDX analysis only one element (Si) from the finder substrate
strong sharp rounded tips 2A 125mm NM-SS 1
or mounted on SEM mounts
Period: 145nm pitch nominal
Hole: 205x237 microns
Multi Holder for 49 Pin Stubs Finder Grid For EDX analysis only oneDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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