DDLTESP-V2 Unmounted Solid metal probes offer excellent

Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes

Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm

with reflective coating

Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 6

DDLTESP-V2 Unmounted Solid metal probes offer excellentDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these