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lateral calibration of SPM scanners and detection of any lateral nonlinearity
PELCO® Grid Storage Boxes
all DUMOSTAR Tweezers are Non-Magnetic and Non-Corrosive
100-200 mesh
Packaging:
Magnification Calibration MRS-3 - Modification 0.35 N/m lateral calibration of SPM scannersDESCRIPTION Modify the MRS 3 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered electron mode, not transmitted. The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the
