292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids Extra bars provide better support

Extra bars provide better support over a large area

or probes in the unmounted probe carrier (model 00-107-0091)

For a sharper ScanAsyst tip for fluid imaging please use the ScanAsyst-Fluid+

10 & 20nm range

AFM: use in contact

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids Extra bars provide better supportDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable