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Silicon tip on Silicon Nitride cantilever
5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtSi Back Side Coating: Reflective Al
This series of probes were designed to continue pushing the limits of the Bruker unique FastScan technology that enables biological observations in fluid in a small volume flow-cell in conjunction with heating control
Check Scan line profile and enlarged view of the tip apex
Improved probe quality and aesthetics
SD-103 Hi-Res Silicon tip on Silicon NitrideSPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.
US$ 11.50
US$ 19.90
US$ 25.00
