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Ships within 48 hours · Estimated delivery Aug 2 - Aug 7
There are three versions available
creep and cross-coupling effects
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2
Version with a 500-200-100nm structure
Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: ≤10nm Tip Height: 0
NCHV-A nanoTA and STHM Samples There are three versions available40N m, 320kHz, Al Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Silicon Probes. Quantity=10 Bruker's Value Line etched silicon probes for imaging in TappingMode and non contact mode in air, with reflective coating. This probe is also available without Aluminum reflex coating as model NCHV. Specifications: 40N m, 320kHz, Al Reflective Coating. Unmounted for use on any AFM. Tip Geometry: Standard (Steep)
US$ 200.00
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US$ 48.00
