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Nanomaterials Characterization Using the K-kit
#16146-32 Dimensions are Ø32 x 10mm (1
these probes provide consistent results over many dozens of images
Single stainless steel set screw into an open slot that is 4mm (0
Included with the Dimension Series AFMs
TEM/FIB Grid Pin Stub, Quad Pin Mount SEM Specimen Holders Nanomaterials Characterization Using the K-kitDESCRIPTION Accepts up to four standard 3mm TEM and FIB grids for easy inspection of film coverage and sample attachment by SEM. Diameter of holder is 18mm (0. 71"), pin length is 6mm (0. 24"). Prod # Description Unit 15493 TEM FIB Grid Pin Stub, Quad each
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